Advanced SI Design Kits (ADK)

Everything you want to do with S parameters in one place

ADK is a comprehensive set of SI utility tools to simplify many commonly encountered SI tasks to a single mouse click. ADK has been used daily for many years in major hardware companies. With ADK, new graduates can be trained to perform the tasks of middle-level SI engineers within a day. Among the 25+ SI Apps are

  • Fill in DC and correct passivity, reciprocity and causality errors in Touchstone files,
  • Convert S parameters into TDR/TDT waveforms,
  • Compute optimized TX tap coefficients, run channel simulation and plot eye diagrams,
  • Convert S parameters into equivalent SPICE models,
  • Combine multiple .snp files,
  • Compliance testing, 2D field solver, S-param viewer and more.

Example 1

ADK corrects causality violation and outputs new Touchstone files for better channel simulation and impedance reading. Note how much the S parameters can change after causality correction.

VOUT (Volt) - S parameters change after causality correction
Z (ohm) - S parameters change after causality correction
RL (dB) - S parameters change after causality correction

Example 2

Converting S parameters into equivalent HSPICE models is just one mouse click away. Attempts to curvefit non-causal models will be futile. ADK’s causality correction ensures that the curvefitted models are also valid beyond the original frequency range.

Converting S parameters into equivalent HSPICE models

Example 3

Going from S parameters to optimized TX FFE and RX CTLE and DFE coefficients and eye diagrams in NRZ or PAM-4 is again only one mouse click away.

Going from S parameters to optimized TX FFE and RX CTLE and DFE coefficients and eye diagrams in NRZ or PAM-4
Going from S parameters to optimized TX FFE and RX CTLE and DFE coefficients and eye diagrams in NRZ or PAM-4