Advanced SI Design Kit (ADK)

Everything you want to do with S parameters in one place

ADK is a comprehensive set of SI utility tools to simplify many commonly encountered SI tasks into a single mouse click. ADK has been used daily for many years in major hardware companies. With ADK, new graduates can be trained to perform the tasks of middle-level SI engineers within a day. Among the 25+ SI Apps are

  • Fill in DC and correct passivity, reciprocity and causality errors in Touchstone files,
  • Convert S parameters into TDR/TDT waveforms,
  • Compute optimized TX tap coefficients, run channel simulation and plot eye diagrams,
  • Convert S parameters into tabular RLGC models,
  • Convert S parameters into equivalent SPICE models,
  • Combine multiple .snp files,
  • Channel Operating Margin (COM) for IEEE 802.3
  • Delta L 4.0 with curvefitted equation and more
  • Many templates to extract DK, DF and roughness
  • Compliance testing (IL, RL, power-sum crosstalk, ICR, ICN, ccICN), 2D field solver, S-param viewer and more.

See Presentation for more details.

Example 1

ADK’s proprietary algorithm corrects casuality error and noise of measurement data where popular vector-fitting-based programs fail to do.

Example 2

Crucial for active-device verification, ADK is the only tool that can de-embed arbitrary N ports from M ports.

Example 3

ADK’s interactive GUI makes DK/DF/SR extraction a breeze.

Example 4

Compliance testing for PCIe 5.0 is just one click away:

Example 5

Delta-L is used to compute PCB loss from multiple Touchstone files of different trace length.  Curvefitted equation is provided.  ADK’s unique automated de-skew feature helps reduce variation of PCB loss.

Without de-skew:
delta_l_no_deskew
With de-skew:

delta_l_deskew

Example 6

Going from S parameters to optimized TX FFE and RX CTLE and DFE coefficients and eye diagrams in NRZ or PAM-4 is only one mouse click away.